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The NSOM 100TM simultaneous
AFM and NSOM (Near-Field scanning optical microscopy)
imaging system from Nanonics.
This unit is capable of performing simultaneous
topographical (AFM) and optical (near-field) imaging
using a flat scanner that can provide a scan range
up to ~ 50 microns in X, Y and up to 30 microns
in the Z direction. Figure 1 shows the NSOM 100
mounted on a vibration isolation table.
The NSOM is based on the AFM technique with the
scanning probe replaced by a cantilevered optical
fiber probe with sub-wavelength apertures in the
range of 50nm -500nm thus providing the capability
to also excite/collect light in the near-field
of the sample either in transmission or reflection
mode. Optical resolutions of 25 nm and topographical
resolution of 50nm can be achieved by this model.
The system can perform both contact and tapping
mode normal force AFM while simultaneously collecting
or illuminating light in the near-field both in
liquid cell and ambient environments. Figure 2
shows the NSOM mounted on a Zeiss optical microscope
system with an Avalanche photo detector (APD)
mounted on top for collecting the reflected (normal
optical reflection or fluorescence) light off
the sample.
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